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Sheet Defect Inspection System (30 micron defects, foreign substances, hairs, etc.)

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Sheet Defect Inspection System(30 micron defects, foreign substances, hairs, etc.)
Features
  • Capture images with high resolution linear multi-camera systems.
  • Built in high contrast lighting system with multilayer length random binding fiber light guide as well as diffused lighting system.
  • Built in feature extraction using next generation image processing device, classification distinguished functions by particle analysis,

Real Color Defect Inspection System

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リアルカラー欠陥検査システム
Features
  • Three plate area color camera, custom lighting system faithful color reproduction.
  • Due inspections by real color algorithms, it is possibly to extract color features automatically without awareness of vector information on RGB and HIS conversions.
  • An intelligent learning method that takes the standard deviation of color variation and brightness change.
  • Provide outstanding high speed and precision with next generation shape pattern matching.
  • Can be equipped with algorithm inspection of scratches and impurities. (Optional)

Real Color Various Defect Inspection System

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Real Color Various Defect Inspection System
Features
  • Three plate area color camera, custom lighting system faithful color reproduction.
  • Due inspections by real color algorithms, it is possibly to extract color features automatically without awareness of vector information on RGB and HIS conversions.
  • An intelligent learning method that takes the standard deviation of color variation and brightness change.
  • Provide outstanding high speed and precision with next generation shape pattern matching.
  • Can be equipped with algorithm inspection of scratches and impurities. (Optional)

Core Device Defect Inspection System

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  1. コアデバイス欠陥検査システム
  2. コアデバイス欠陥検査システム
Features
  • Can capture high resolution high contrasting images by high-resolution cameras and exclusive custom lighting system.
  • Being equipped with next generation algorithm inspection machine, it can reliably detect fine defects while allowing standard deviation or unevenness.
  • Multi camera configuration (2 high-resolution high-definition cameras), next generation algorithm inspection machine.
  • Even though it is fully specified, it can achieve high speeds of 800 per minute.

Vial Container Defect Inspection System

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  1. バイアル瓶欠陥検査システム
  2. バイアル瓶欠陥検査システム
  3. バイアル瓶欠陥検査システム
Features
  • Image capturing with linear line area camera and high-resolution cameras.
  • Defect extraction and high speed scanning system by light refraction.
  • Algorithm inspection with next generation image processing device.

One Way Bottle Defect Inspection System

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  1. ワンウエイボトル欠陥検査システム
  2. ワンウエイボトル欠陥検査システム
Features
  • Defect inspection by 360 degree view.
  • High contrast image capturing by custom optical lighting systems.
  • Divided Powder ・Stick Inspection System
  • Next generation algorithm inspection machine software installed.
  • Multi camera (consisting of 5) ultra fast processing of 1,200/minute.

Liquid Surface Defect Inspection System

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液面検査システム
Features
  • Captures images using high-resolution high-definition cameras.
  • Next generation algorithm inspection machine software installed.
  • Correction of bubbles near the boundary levels.

Divided Powder ・Stick Inspection System

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  1. 分包・スティック検査システム
  2. 分包・スティック検査システム
Features
  • Capture images with multi camera systems and custom optical lighting systems.
  • Granular mixing and particle inspections with next generation algorithm inspection machine software.